GCOE CEDI Osaka Univ.

大阪大学グローバルCOEプログラム Center for Electronic Devices Innovation

大阪大学グローバルCOEプログラム 次世代電子デバイス教育研究開発拠点

HOME > 実績報告 > 論文 > 阿部 真之
阿部 真之 [工学研究科(電気電子情報工学専攻)･准教授]
  1. D. Sawada, Y. Sugimoto, K. Morita, M. Abe and S. Morita, “Simultaneous measurement of force and tunneling current at room temperature”, Applied Physics Letters Vol.94, Issue 17, 173117-1~173117-3(2009).
  2. D. Sawada, A. Hirai, Y. Sugimoto, M. Abe and S. Morita, “Simultaneous Atomic Imaging of Atomic Force Microscopy and Scanning Tunneling Microscopy Using Metal Coated Cantilevers”, Materials Transactions Vol.50 No.5, pp.940-942(2009).
  3. O. Custance, R. Perez and S. Morita, “Atomic force microscopy as a tool for atom manipulation”, Nature Nanotechnology Vo.4 No.12 pp.803-810(2009).
  4. S. Sadewasser, P. Jelinek, C. Fang, O. Custance, Y. Yamada, Y. Sugimoto, M. Abe, and S. Morita, “New insights on atomic-resolution frequency-modulated Kelvin-probe force-microscopy imaging of semiconductors”, Physical Review Letters Vol.103, Issue 26,266103(2009).
  5. A. Ohiso, M. Hiragaki, K. Mizuta, Y. Sugimoto, M. Abe, and S. Morita, “Atom-by-atom chemical coordination effect observed in noncontact AFM topography of Pb/Si(111)-(√3x√3) mosaic phase,”e-Journal of Surface Science and Nanotechnology vol.6, pp.79-83 (2008).
  6. A. Ohiso, Y. Sugimoto, M. Abe, and S. Morita, “Tip-induced local reconstruction on the Pb/Ge(111) surface using frequency modulation atomic force microscopy”, Japanese Journal of Applied Physics vol.46, No.8B., pp. 5582-5585 (2007).
  7. Daisuke Sawada,Takashi Namikawa,Masuhiro Hiragaki,Yoshiaki Sugimoto,Masayuki Abe,Seizo Morita, “High Spatial Resolution Topographic Imaging and Dimer Distance Analysis of Si(100)-(2x1) Using Non-contact Atomic Force Microscopy,” Japanese Journal of Applied Physics (JJAP) Vol. 47, No. 7B, pp. 6085-6087 (2008).
  8. M. Abe, Y. Sugimoto, T. Namikawa, K. Morita, N. Oyabu, and S. Morita, “Drift-compensated data acquisition performed at room temperature with frequency modulation atomic force microscopy,”Applied Physics Letters, vol.90, No.20, p.203103 (2007).
  9. T. Matsukawa, Y. Takahashi, T. Tokiyama, K. Sasai,Y. Murai, N. Hirota, Y. Tominari, N. Mino, M. Yoshimura, M. Abe, J. Takeya, Y. Kitaoka, Y. Mori, S. Morita, and T. Sasaki, “Solution growth of rubrene single crystals using various organic solvents,” Japanese Journal of Applied Physics, Vol.47, No.12, pp.8950-8954 (2008).
  10. V. Kittichungchit, T. Shibata, H. Noda, H. Tanaka, A. Fujii, N. Oyabu, M. Abe, S. Morita and M. Ozaki, “Efficiency Enhancement in Organic Photovoltaic Cell with Interpenetrating ConductingPolymer/C60 Heterojunction Structure by Substrate-Heating Treatment,” Jpn. J. Appl. Phys. 47, 1094-1097 (2008).
  11. Y. Seino, S. Yoshikawa, M. Abe, and S. Morita, “Growth dynamics of insulating SrF2 films on Si(111),” Journal of Physics: Condense Matter vol.19, p.445001-445009 (2007).
  12. Y. Sugimoto, K. Miki, M. Abe, and S. Morita, “Statistics of lateral atom manipulation by atomic force microscopy at room temperature,” Physical Review B Vol.78, No.20, 205305 (2008).
  13. Y. Sugimoto, S. Innami, M. Abe, O. Custance, and S. Morita, “Dynamic force spectroscopy using cantilever higher flexural modes,” Applied Physics Letters, vol.91, p.093120-1-3 (2007).
  14. Yoshiaki Sugimoto, Pablo Pou, Oscar Custance, Pavel Jelinek, Masayuki Abe, Ruben Perez, and Seizo Morita, “Complex Patterning by Vertical Interchange Atom Manipulation Using Atomic Force Microscopy,” Science Vol.322, Issue 5900, pp.413-417 (2008).
  15. Yoshiaki Sugimoto, Takashi Namikawa, Koutaro Miki, Masayuki Abe and Seizo Morita, “Vertical and lateral force mapping on the Si(111)-(7x7) surface by dynamic force microscopy,” Phys.Rev.B Volume 77, No. 19, pp.195424-1~195424-9 (2008).
  16. Yoshiaki Sugimoto, Takashi Namikawa, Masayuki Abe, and Seizo Morita, “Mapping and imaging for rapid atom discrimination: A study of frequency modulation atomic force microscopy,” Appl. Phys. Lett. Vol. 94, Issue 2, 023108 (2009).
  17. Y. Sugimoto, P. Pou, M. Abe, P. Jelinek, R. Perez, S. Morita, and O. Custance, “Chemical identification of individual surface atoms by atomic force microscopy,” Nature Vol.446, pp.64-67 (2007)
ページトップ