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IDER/IDER42-.3.21()(1)H. Ham, T. Matsuoka, and K. Taniguchi,"Application of Noise-Enhanced Detection of Subthreshold Signals for Communication Systems," IEICE Trans. on Fundamentals, Vol. E92-A, No. 4, pp. 1012-1018, Apr. 2009.(2) T. Kihara, H.-J. Park, I. Takobe, F. Yamashita, T. Matsuoka, and K. Taniguchi,"A 0.5 V Area-Efficient Transformer Folded-CascodeCMOS Low-Noise Amplifier," IEICE Trans. Electron, Vol. E92-C, No. 4, pp. 564-575, Apr. 2009. (3) F. Yamashita, T. Matsuoka, T. Kihara, I. Takobe, H.-J. Park, and K. Taniguchi,"Analytical design of a 0.5V 5GHz CMOS LC-VCO," IEICE Electronics Express, Vol. 6, No. 14, pp. 1025-1031, July 2009. (4) T. Matsuoka, J. Wang, T. Kihara, H. Ham, and K. Taniguchi, "Low-Voltage Wireless Analog CMOS Circuits toward 0.5 V Operation," IEICE Trans. on Fundamentals A, Vol. E93-A, No. 2, pp.356-366,Feb. 2010.(5),,,, "CMOS", C, Vol.J92-C, pp. 75-77, Feb. 2010.(6) S. Sadewasser, P. Jelinek, C.-K. Fang, O. Custance, Y. Yamada, Y. Sugimoto, M. Abe, and S. Morita,New insights on atomic-resolution Frequency-Modulation Kelvin Probe Force Microscopy imaging on semiconductors, Physical Review Letters Vol.103, pp.266103-1/266103-4 (2009).(7) D. Sawada, Y. Sugimoto, K. Morita, M. Abe and S. Morita,Simultaneous measurement of force and tunneling current at room temperature, Applied Physics Letters Vol.94, pp.173117-1/173117-3 (2009).(8) Y. Sugimoto, T. Namikawa, M. Abe, and S. Morita,Mapping and imaging for rapid atom discrimination: A study of frequency modulation atomic force microscopy, Applied Physics Letters vol.94, pp.023108-1/023108-3 (2009).(9) H. Suto, Y. Murata, T. Matsumoto, Y. Enomoto, M. Morifuji, S. Honda, and M. Katayama, Scanning Tunneling Microscopy and Spectroscopy Study of a Steep Facet Surface on Ge Nanocrystal Grown on Si(111)", Applied Physics Express vol. 2 (2009) 035002/1-035002/3.ABCABCNOXSOXCOX67

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